X-Ray fluorescence (XRF) is a technique to analysis of various materials. We have two types of techniques in XRF.They are Energy dispersive X Ray Flouroscence (EDXRF) and Wave length dispersive X Ray flouroscence. The effective method to find the chemical profile of the element is WDXRF. This wavelength dispersive X ray fluorescence (WDXRF) will be used to check the nuclear design of different compounds. The study of relative intensity ratios of various satellite peaks of different elements is associated with their atomic spectral structures. The intensity ratios will give the validity of the Hatree-slater model of different combinations. In this paper, we will present energy versus intensity and data obtained using WDXRF of strontium in addition to the previous work on Molybdenum and its compounds.