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Optimization of ZnO Thin Films using Sol-Gel Dip Coating by Taguchi Method

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Rajath H G, H V Byregowda , Siddesh Kumar N M
» doi: 10.48047/ecb/2023.12.8.59

Abstract

The purpose of this study was to use the Taguchi approach to examine as little as is practical to understand the ideal circumstances for producing thin films of ZnO with excellent attributes. Sol-gel dip coating was used to produce a thin layer of zinc oxide on a glass substrate while it remained at room temperature. An L9 trial plan of three levels high, medium, and low with four elements such as annealing temperature, speed of dip coating, the concentration of precursor, and annealing time was employed. The test was repeated three times, and three sol-gel configurations were made for each paper. We have decided to carry out the optimization using the estimated gap energy derived from the obtained film transmittance. Spectrophotometric analysis was used to characterize each sample. We were able to determine each ZnO thin film’s gap energy that was deposited due to this characterization, which also enabled us to create the transmittance curve. To ascertain the electrical and optical characteristics, a signal-to-noise analysis and an analysis of variance (ANOVA) were utilized. In a formal declaration made under oath, the thin film of ZnO showed excellent crystal quality and more than 90% transmittance.

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