Nanogranular thin films of copper sulfide (Cu2S) deposited by self-organized Arrested Precipitation Technique. The deposited Cu2S films were characterized for optical, structural, and morphological properties. Optical absorption study suggested the band gap energy decreased from 2.91 to 2.26 eV with increasing precursor concentration. X-ray diffraction results indicate that APT is a favorable technique to synthesize pure nanocrystalline Cu2S thin films having a monoclinic crystal structure. An electrochemical impedance spectroscopy analysis confirms the charge transfer resistance and electron lifetime. X-ray photoelectron spectroscopy reveals stochastic at valance state of Cu2S.