X-ray diffraction (XRD) and electron diffraction methods (EDAX) are powerful techniques for studying the atomic structure of materials. XRD is particularly useful for determining the crystal structure of single crystals and powders, while EDAX can provide information on the composition and crystallographic orientation of materials at the nanoscale. X-ray topography is another XRD-based technique that allows for the visualization of crystal defects such as dislocations, stacking faults, and grain boundaries. By analyzing the diffraction pattern produced by a crystal, x-ray topography can provide information on the type and distribution of defects within the crystal lattice. In addition to XRD and EDAX, there are other techniques that can be used to study the atomic structure of materials, such as neutron diffraction, transmission electron microscopy (TEM), and scanning electron microscopy (SEM). Each technique has its own advantages and limitations, and the choice of technique depends on the specific research question and the properties of the sample being studied.